單片機(jī)廣泛應(yīng)用于商業(yè)：諸如調(diào)制解調(diào)器，電動機(jī)控制系統(tǒng)，空調(diào)控制系統(tǒng)，汽車發(fā)動機(jī)和其他一些領(lǐng)域。這些單片機(jī)的高速處理速度和增強(qiáng)型外圍設(shè)備集合使得它們適合于這種高速事件應(yīng)用場合。然而，這些關(guān)鍵應(yīng)用領(lǐng)域也要求這些單片機(jī)高度可靠。健壯的測試環(huán)境和用于驗(yàn)證這些無論在元部件層次還是系統(tǒng)級別的單片機(jī)的合適的工具環(huán)境保證了高可靠性和低市場風(fēng)險(xiǎn)。Intel 平臺工程部門開發(fā)了一種面向?qū)ο蟮挠糜隍?yàn)證它的AT89C51 汽車單片機(jī)多線性測試環(huán)境。這種環(huán)境的目標(biāo)不僅是為AT89C51 汽車單片機(jī)提供一種健壯測試環(huán)境，而且開發(fā)一種能夠容易擴(kuò)展并重復(fù)用來驗(yàn)證其他幾種將來的單片機(jī)。開發(fā)的這種環(huán)境連接了AT89C51。本文討論了這種測試環(huán)境的設(shè)計(jì)和原理，它的和各種硬件、軟件環(huán)境部件的交互性，以及如何使用AT89C51。


Microcontrollers are used in a multitude of commercial applications such as modems, motor-control systems, air conditioner control systems, automotive engine and among others. The high processing speed and enhanced peripheral set of these microcontrollers make them suitable for such high-speed event-based applications. However, these critical application domains also require that these microcontrollers are highly reliable. The high reliability and low market risks can be ensured by a robust testing process and a proper tools environment for the validation of these microcontrollers both at the component and at the system level. Intel Plaform Engineering department developed an object-oriented multi-threaded test environment for the validation of its AT89C51 automotive microcontrollers. The goals of thisenvironment was not only to provide a robust testing environment for the AT89C51 automotive microcontrollers, but to develop an environment which can be easily extended and reused for the validation of several other future microcontrollers. The environment was developed in conjunction with Microsoft Foundation Classes (AT89C51). The paper describes the design and mechanism of this test environment,